Borgoni, Riccardo
 Distribuzione geografica
Continente #
NA - Nord America 304
EU - Europa 243
AS - Asia 146
SA - Sud America 29
AF - Africa 1
OC - Oceania 1
Totale 724
Nazione #
US - Stati Uniti d'America 301
DE - Germania 81
SG - Singapore 76
CN - Cina 40
IT - Italia 40
SE - Svezia 33
UA - Ucraina 32
BR - Brasile 27
FR - Francia 13
FI - Finlandia 12
IE - Irlanda 10
IN - India 8
RU - Federazione Russa 8
ID - Indonesia 7
GB - Regno Unito 6
TR - Turchia 6
PL - Polonia 3
VN - Vietnam 3
MX - Messico 2
NL - Olanda 2
AT - Austria 1
AU - Australia 1
AZ - Azerbaigian 1
BD - Bangladesh 1
BE - Belgio 1
CO - Colombia 1
EG - Egitto 1
ES - Italia 1
GT - Guatemala 1
IQ - Iraq 1
JO - Giordania 1
JP - Giappone 1
SA - Arabia Saudita 1
VE - Venezuela 1
Totale 724
Città #
Chandler 50
Singapore 29
Ashburn 28
Jacksonville 24
New York 16
Salerno 15
San Mateo 13
Dearborn 11
Woodbridge 11
Dublin 10
Seattle 10
Houston 8
Nanjing 8
Jakarta 7
Milan 7
Wilmington 7
Guidonia 6
Moscow 5
Beijing 4
Boston 4
Cattolica 4
Dallas 4
Hebei 4
Helsinki 4
Los Angeles 4
Princeton 4
Santa Clara 4
Buffalo 3
Curitiba 3
Falkenstein 3
Indiana 3
Izmir 3
Kocaeli 3
Lawrence 3
Mountain View 3
Redwood City 3
Ann Arbor 2
Biên Hòa 2
Changsha 2
Guangzhou 2
Hefei 2
Manchester 2
Munich 2
Segrate 2
University Park 2
Actopan 1
Amman 1
Amparo 1
Amsterdam 1
Andover 1
Augusta 1
Baku 1
Belo Horizonte 1
Biandronno 1
Birmingham 1
Boardman 1
Busto Arsizio 1
Cachoeirinha 1
Canoas 1
Caracas 1
Chicago 1
Cruz 1
Damietta 1
Dammam 1
Divino 1
Duncan 1
Duque de Caxias 1
Ervália 1
Florianópolis 1
Foz do Iguaçu 1
Frascati 1
Fremont 1
Gent 1
Guatemala City 1
Gwalior 1
Ho Chi Minh City 1
Hyattsville 1
Ipatinga 1
Itapissuma 1
Itaporanga 1
Jaú 1
Jiaxing 1
Juiz de Fora 1
Kent 1
Kraków 1
London 1
Magé 1
Marília 1
Matozinhos 1
Medellín 1
Medianeira 1
Merrillville 1
Milwaukee 1
Nanchang 1
Newark 1
Ningbo 1
Norwalk 1
Nuremberg 1
Old Bridge 1
Orangeburg 1
Totale 401
Nome #
Statistics for microelectronics 122
Response surface prediction from a spatial montoring process 121
LogVariance modeling of wafer surface 112
Risk of Congenital Malformations and Enviromental Pollution in Lombardy 109
Optimal reduction of a monitoring grid for SiO2 deposition surface over a wafer for semiconductor devices 90
Optimal reduction of a spatial monitoring grid: Proposals and applications in process control 89
Selecting subgrids from a spatial monitoring network: Proposal and application in semiconductor manufactoring process 88
Totale 731
Categoria #
all - tutte 3.109
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 3.109


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2020/202132 0 0 0 0 0 5 7 1 7 4 8 0
2021/202259 6 6 0 9 0 3 0 10 1 1 10 13
2022/2023126 10 16 15 15 13 20 1 9 20 1 2 4
2023/202459 3 12 2 8 0 14 1 0 2 1 11 5
2024/202583 4 2 7 0 3 13 1 1 11 9 19 13
2025/2026108 28 4 12 18 44 2 0 0 0 0 0 0
Totale 731