Borgoni, Riccardo
 Distribuzione geografica
Continente #
NA - Nord America 362
EU - Europa 250
AS - Asia 179
SA - Sud America 33
AF - Africa 1
OC - Oceania 1
Totale 826
Nazione #
US - Stati Uniti d'America 359
SG - Singapore 91
DE - Germania 81
CN - Cina 45
IT - Italia 41
SE - Svezia 33
UA - Ucraina 32
BR - Brasile 31
FR - Francia 19
FI - Finlandia 12
IE - Irlanda 10
IN - India 10
VN - Vietnam 10
RU - Federazione Russa 8
ID - Indonesia 7
GB - Regno Unito 6
TR - Turchia 6
PL - Polonia 3
HK - Hong Kong 2
IQ - Iraq 2
JP - Giappone 2
MX - Messico 2
NL - Olanda 2
AT - Austria 1
AU - Australia 1
AZ - Azerbaigian 1
BD - Bangladesh 1
BE - Belgio 1
CO - Colombia 1
EG - Egitto 1
ES - Italia 1
GT - Guatemala 1
JO - Giordania 1
SA - Arabia Saudita 1
VE - Venezuela 1
Totale 826
Città #
Chandler 50
Singapore 43
Ashburn 41
San Jose 33
Jacksonville 24
New York 17
Salerno 15
San Mateo 13
Dearborn 11
Woodbridge 11
Dublin 10
Seattle 10
Houston 8
Nanjing 8
Jakarta 7
Milan 7
Wilmington 7
Guidonia 6
Lauterbourg 6
Moscow 5
Beijing 4
Boston 4
Cattolica 4
Dallas 4
Hebei 4
Helsinki 4
Los Angeles 4
Princeton 4
Santa Clara 4
Buffalo 3
Curitiba 3
Falkenstein 3
Ho Chi Minh City 3
Indiana 3
Izmir 3
Kocaeli 3
Lawrence 3
Mountain View 3
Redwood City 3
Ann Arbor 2
Biên Hòa 2
Changsha 2
Guangzhou 2
Hefei 2
Hong Kong 2
Manchester 2
Munich 2
Rio de Janeiro 2
Segrate 2
University Park 2
Actopan 1
Ahmedabad 1
Amman 1
Amparo 1
Amsterdam 1
Andover 1
Augusta 1
Baku 1
Belo Horizonte 1
Biandronno 1
Birmingham 1
Boardman 1
Busto Arsizio 1
Bắc Ninh 1
Bến Tre 1
Cachoeirinha 1
Canoas 1
Caracas 1
Chennai 1
Chicago 1
Cruz 1
Da Nang 1
Damietta 1
Dammam 1
Divino 1
Duncan 1
Duque de Caxias 1
Ervália 1
Everett 1
Florianópolis 1
Foz do Iguaçu 1
Frascati 1
Fremont 1
Gent 1
Guatemala City 1
Gwalior 1
Haiphong 1
Huế 1
Hyattsville 1
Ipatinga 1
Itapissuma 1
Itaporanga 1
Jaú 1
Jiaxing 1
Juiz de Fora 1
Kent 1
Kraków 1
London 1
Magé 1
Marília 1
Totale 470
Nome #
Statistics for microelectronics 142
Response surface prediction from a spatial montoring process 136
LogVariance modeling of wafer surface 125
Risk of Congenital Malformations and Enviromental Pollution in Lombardy 121
Selecting subgrids from a spatial monitoring network: Proposal and application in semiconductor manufactoring process 108
Optimal reduction of a monitoring grid for SiO2 deposition surface over a wafer for semiconductor devices 103
Optimal reduction of a spatial monitoring grid: Proposals and applications in process control 101
Totale 836
Categoria #
all - tutte 3.365
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 3.365


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2020/202112 0 0 0 0 0 0 0 0 0 4 8 0
2021/202259 6 6 0 9 0 3 0 10 1 1 10 13
2022/2023126 10 16 15 15 13 20 1 9 20 1 2 4
2023/202459 3 12 2 8 0 14 1 0 2 1 11 5
2024/202583 4 2 7 0 3 13 1 1 11 9 19 13
2025/2026213 28 4 12 18 44 11 51 9 15 21 0 0
Totale 836