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EnglishThe thermal boundary resistance at the interface between a nanosized Al film and an Al2O3 substrate is investigated at an atomistic level. The thermal dynamics occurring in time-resolved thermoreflectance experiments is then modeled via macrophysics equations upon insertion of the materials parameters obtained from atomistic simulations. Electrons and phonons nonequilibrium and spatiotemporal temperatures inhomogeneities are found to persist up to the nanosecond time scale. These results question the validity of the commonly adopted lumped thermal capacitance model in interpreting transient nanocalorimetry experiments. The strategy adopted in the literature to extract the thermal boundary resistance from transient reflectivity traces is revised in the light of the present findings. The results are of relevance beyond the specific system, the physical picture being general and readily extendable to other heterojunctions.
Caddeo, C., Melis, C., Ronchi, A., Giannetti, C., Ferrini, G., Rurali, R., Colombo, L., Banfi, F., Thermal boundary resistance from transient nanocalorimetry: A multiscale modeling approach, <<PHYSICAL REVIEW. B>>, 2017; 95 (8): N/A-N/A. [doi:10.1103/PhysRevB.95.085306] [http://hdl.handle.net/10807/98318]
| Autori: | ||
| Titolo: | Thermal boundary resistance from transient nanocalorimetry: A multiscale modeling approach | |
| Digital Object Identifier (DOI): | http://dx.doi.org/10.1103/PhysRevB.95.085306 | |
| Indirizzo URL alternativo: | https://journals.aps.org/prb/abstract/10.1103/PhysRevB.95.085306 https://arxiv.org/abs/1611.04042 | |
| Data di pubblicazione: | 2017 | |
| Abstract: | The thermal boundary resistance at the interface between a nanosized Al film and an Al2O3 substrate is investigated at an atomistic level. The thermal dynamics occurring in time-resolved thermoreflectance experiments is then modeled via macrophysics equations upon insertion of the materials parameters obtained from atomistic simulations. Electrons and phonons nonequilibrium and spatiotemporal temperatures inhomogeneities are found to persist up to the nanosecond time scale. These results question the validity of the commonly adopted lumped thermal capacitance model in interpreting transient nanocalorimetry experiments. The strategy adopted in the literature to extract the thermal boundary resistance from transient reflectivity traces is revised in the light of the present findings. The results are of relevance beyond the specific system, the physical picture being general and readily extendable to other heterojunctions. | |
| Lingua: | Inglese | |
| Rivista: | ||
| Citazione: | Caddeo, C., Melis, C., Ronchi, A., Giannetti, C., Ferrini, G., Rurali, R., Colombo, L., Banfi, F., Thermal boundary resistance from transient nanocalorimetry: A multiscale modeling approach, <<PHYSICAL REVIEW. B>>, 2017; 95 (8): N/A-N/A. [doi:10.1103/PhysRevB.95.085306] [http://hdl.handle.net/10807/98318] | |
| Appare nelle tipologie: | Articolo in rivista, Nota a sentenza |
File in questo prodotto:
| File | Descrizione | Tipologia | Note | Licenza | |
|---|---|---|---|---|---|
| 1611.04042.pdf | arXiv version of the manuscript | Postprint (versione finale dell’autore successiva alla peer-review) | Nessuna Nota |  | Open Access Visualizza/Apri |
http://hdl.handle.net/10807/98318
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