Experimental evidence of differences in the electronic properties of an insulating and a conducting SrTiO3/LaAlO3 interface is provided by soft x-ray spectroscopies. While core level photoemission measurements show that only at the conducting interface Ti ions with 3+ ionization state are present, by using resonant photoemission and x-ray absorption spectroscopies, it is shown that in both samples in-gap states with a Ti 3d character are present, but their density is higher at the conducting interface.
Drera, G., Banfi, F., Canova, F., Borghetti, P., Sangaletti, L. E., Bondino, F., Magnano, E., Huijben, J., Huijben, M., Rijnders, G., Blank, D., Hilgenkamp, H., Brinkman, A., Spectroscopic evidence of in-gap states at the SrTiO3/LaAlO3 ultrathin interfaces, <<APPLIED PHYSICS LETTERS>>, 2011; 98 (5): N/A-N/A. [doi:10.1063/1.3549177] [http://hdl.handle.net/10807/9126]
Spectroscopic evidence of in-gap states at the SrTiO3/LaAlO3 ultrathin interfaces
Drera, Giovanni;Banfi, Francesco;Sangaletti, Luigi Ermenegildo;
2011
Abstract
Experimental evidence of differences in the electronic properties of an insulating and a conducting SrTiO3/LaAlO3 interface is provided by soft x-ray spectroscopies. While core level photoemission measurements show that only at the conducting interface Ti ions with 3+ ionization state are present, by using resonant photoemission and x-ray absorption spectroscopies, it is shown that in both samples in-gap states with a Ti 3d character are present, but their density is higher at the conducting interface.File | Dimensione | Formato | |
---|---|---|---|
APL_98_052907_2011.pdf
accesso aperto
Descrizione: Copyright (2011) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.
Dimensione
228.39 kB
Formato
Adobe PDF
|
228.39 kB | Adobe PDF | Visualizza/Apri |
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.