A total quenching of the charge transfer related emission is observed in the 3s photoelectron spectra of NiO single crystals taken at hv= 180 eV photon energy. This finding is related to an efficient screening mechanism of the 3s core hole which prevents the stabilization of charge transfer derived configurations in the final state of the photoemission process, leading to a spectrum with the lone high and low-spin exchange components. (C) 1999 Elsevier Science Ltd, All rights reserved.
Sangaletti, L. E., Parmigiani, F., Goldoni, A., Ferrini, G., Sangalli, P., Peloi, M., Charge transfer quenching in the photoemission spectra of NiO, <<SOLID STATE COMMUNICATIONS>>, 1999; 112 (10): 549-553. [doi:10.1016/S0038-1098(99)00396-8] [https://hdl.handle.net/10807/324523]
Charge transfer quenching in the photoemission spectra of NiO
Sangaletti, Luigi Ermenegildo;Parmigiani, Fulvio;Ferrini, Gabriele;
1999
Abstract
A total quenching of the charge transfer related emission is observed in the 3s photoelectron spectra of NiO single crystals taken at hv= 180 eV photon energy. This finding is related to an efficient screening mechanism of the 3s core hole which prevents the stabilization of charge transfer derived configurations in the final state of the photoemission process, leading to a spectrum with the lone high and low-spin exchange components. (C) 1999 Elsevier Science Ltd, All rights reserved.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.



