This paper deals first of all with an improvement of the Kelvin probe KP. theory taking into consideration the series resistance of the input circuit. Then it illustrates a number of work function measurements performed on self-assembled monolayers interacting with varieties of analytes, and on Langmuir–Blodgett LB. films of porphyrins of different thickness. The output intensities of the work function have been investigated and comments are given of the results obtained. The link between the work function and thickness of material under test has been analyzed and discussed as a method for the coverage factor estimation of absorbing surfaces.
D’Amico, A., Di Natale, C., Paolesse, R., Mantini, A., Goletti, C., Davide, F., Filosofi, G., Chemical sensing materials characterization by Kelvin probe technique, <<SENSORS AND ACTUATORS. B, CHEMICAL>>, 2000; 70 (1-3): 254-262. [doi:10.1016/S0925-4005(00)00577-3] [http://hdl.handle.net/10807/191146]
Chemical sensing materials characterization by Kelvin probe technique
Mantini, AlessandroMembro del Collaboration Group
;
2000
Abstract
This paper deals first of all with an improvement of the Kelvin probe KP. theory taking into consideration the series resistance of the input circuit. Then it illustrates a number of work function measurements performed on self-assembled monolayers interacting with varieties of analytes, and on Langmuir–Blodgett LB. films of porphyrins of different thickness. The output intensities of the work function have been investigated and comments are given of the results obtained. The link between the work function and thickness of material under test has been analyzed and discussed as a method for the coverage factor estimation of absorbing surfaces.
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