In this paper the serial independence tests known as SIS (Serial Independence Simultaneous) and SICS (Serial Independence Chi-Square) are considered. These tests are here contextualized in the model validation phase for nonlinear models in which the underlying assumption of serial independence is tested on the estimated residuals. Simulations are used to explore the performance of the tests, in terms of size and power, once a linear/nonlinear model is fitted on the raw data. Results underline that both the tests are powerful against various types of alternatives.

Bagnato, L., Punzo, A., Checking Serial Independence of Residuals from a Nonlinear Model, in Gaul, W., Geyer-Shulz, A., Schmidt-Thieme, L., Kunze, J. (ed.), Challenges at the Interface of Data Analysis, Computer Science and Optimization. Studies in Classification, Data Analysis, and Knowledge Organization, Springer, Berlino 2012: 203- 211. 10.1007/978-3-642-24466-7_21 [http://hdl.handle.net/10807/40392]

Checking Serial Independence of Residuals from a Nonlinear Model

Bagnato, Luca;
2012

Abstract

In this paper the serial independence tests known as SIS (Serial Independence Simultaneous) and SICS (Serial Independence Chi-Square) are considered. These tests are here contextualized in the model validation phase for nonlinear models in which the underlying assumption of serial independence is tested on the estimated residuals. Simulations are used to explore the performance of the tests, in terms of size and power, once a linear/nonlinear model is fitted on the raw data. Results underline that both the tests are powerful against various types of alternatives.
2012
AREA13 - SCIENZE ECONOMICHE E STATISTICHE
Capitolo di libro con editore internazionale
Inglese
Challenges at the Interface of Data Analysis, Computer Science and Optimization. Studies in Classification, Data Analysis, and Knowledge Organization
Gaul, Wolfgang; Geyer-Shulz, Andreas; Schmidt-Thieme, Lars; Kunze, Jonas
Contributo in volume (capitolo o saggio)
Inglese
Model validation
Nonlinear time series
Settore SECS-S/01 - STATISTICA
978-3-642-24465-0
978-3-642-24466-7
Springer
Germany
Berlino
203
211
9
Esperti anonimi
268
none
02. Contributo in libro::In libro con curatela: Capitolo o saggio; Prefazione/Postfazione; Breve introduzione; Schede di catalogo, repertorio o corpus
info:eu-repo/semantics/bookPart
2
Bagnato, L., Punzo, A., Checking Serial Independence of Residuals from a Nonlinear Model, in Gaul, W., Geyer-Shulz, A., Schmidt-Thieme, L., Kunze, J. (ed.), Challenges at the Interface of Data Analysis, Computer Science and Optimization. Studies in Classification, Data Analysis, and Knowledge Organization, Springer, Berlino 2012: 203- 211. 10.1007/978-3-642-24466-7_21 [http://hdl.handle.net/10807/40392]
MIUR_libropart_23
Bagnato, Luca; Punzo, Antonio
File in questo prodotto:
Non ci sono file associati a questo prodotto.

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/10807/40392
Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus 9
  • ???jsp.display-item.citation.isi??? ND
social impact